Auger sputtering profiling of an Al0.3Ga0.7As/GaAs superlattice grown by molecular beam epitaxy
- 1 January 1992
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 56-58, 708-712
- https://doi.org/10.1016/0169-4332(92)90326-s
Abstract
No abstract availableKeywords
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