Amorphous to microcrystalline transitions in Si films
- 1 March 1983
- journal article
- Published by Elsevier in Physica B+C
- Vol. 117-118, 950-952
- https://doi.org/10.1016/0378-4363(83)90704-0
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Effect of annealing on the optical gap of a-Si:HJournal of Physics C: Solid State Physics, 1981
- Raman scattering from small particle size polycrystalline siliconSolid State Communications, 1981
- Proton Magnetic Resonance Spectra of Plasma-Deposited Amorphous Si: H FilmsPhysical Review Letters, 1980
- Raman study of laser annealed siliconSolid State Communications, 1979