Combining four-crystal seven-reflection and three-crystal five-reflection diffractometry for the characterization of ZnSe layers grown on GaAs by MOVPE
- 14 April 1993
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 26 (4A) , A35-A40
- https://doi.org/10.1088/0022-3727/26/4a/008
Abstract
No abstract availableKeywords
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