The effect of rapid thermal annealing on structural and electrical properties of TiB2 thin films
- 1 May 1997
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 300 (1-2) , 272-277
- https://doi.org/10.1016/s0040-6090(96)09458-8
Abstract
No abstract availableKeywords
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