A 12.5 Gb/s Si bipolar IC for PRBS generation and bit error detection up to 25 Gb/s
- 1 January 1993
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 26, 152-153
- https://doi.org/10.1109/isscc.1993.280033
Abstract
Reliable testing at multi-Gb/s frequencies has become a major issue in the development of high-speed optical fiber communication systems and components. According to CCITT recommendation O.151, pseudorandom binary sequences (PRBS) are required for testing. Commercially available hybrid PRBS test equipment covers data rates up to about 15 Gb/s. The test of circuits for data rates above 15 Gb/s relies on custom-tailored equipment. A monolithic solution to the test problem that offers PRBS generation, bit-error detection, scrambling, and descrambling for two channels to 12.5 Gb/s with on-chip trigger derivation is presented. A 1-channel PRBS up to 25 Gb/s is directly derived from two outputs by external multiplexing. Sequence length is switchable between 2/sup 11/-1 and 2/sup 15/-1 (CCITT rec.).Keywords
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