NiTi thin film characterization by Rutherford backscattering spectrometry
- 1 September 1996
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 40 (2-3) , 185-189
- https://doi.org/10.1016/0921-5107(96)01593-0
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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