The evaluation of 16-Mbit memory chips with built-in reliability
- 1 January 1992
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Highly defective 16-Mb chips have been stressed under accelerated conditions to test the capability of on-chip error-correction circuits for reliability enhancement. The tradeoff between a manufacturing sort or screen yield and reliability was determined. The soft-error immunity of the trench capacitor technology in conjunction with error correction was also evaluated under accelerated conditions.Keywords
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