The plasma reflection edge in thin films of semiconductors
- 1 June 1970
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 3 (6) , 863-870
- https://doi.org/10.1088/0022-3727/3/6/305
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Related optical and electrical properties of thin films of indium arsenideJournal of Physics D: Applied Physics, 1970
- Getter evaporation of pure thin films of indium antimonideJournal of Physics D: Applied Physics, 1970
- Use of plasma edge reflection measurements in the study of semiconductorsJournal of Physics C: Solid State Physics, 1968
- Optical properties of thin films of indium arsenideJournal of Physics D: Applied Physics, 1968
- Measurement of the Conductivity Effective Mass in Semiconductors Using Infrared ReflectionPhysical Review B, 1964
- The preparation and study of the optical absorption edge of thin films of gallium arsenideJournal de Physique, 1964