Dependence of resonant tunneling current on well widths in AlAs/GaAs/AlAs double barrier diode structures

Abstract
The dependence of current components on GaAs well widths is studied in AlAs/GaAs/AlAs double barrier diode structures having AlAs barriers of 8 atomic layers. It is shown for the first time that the density JRT of resonant current varies from 8×102 to 1.6×104 A cm−2 by the choice of the well width from 9 to 5 nm in accordance with theoretical calculations. Furthermore, one of these diodes shows excellent current-voltage characteristics at room temperature with a peak to valley ratio of 3, the highest value ever reported.