Limits of imaging resolution for atomic force microscopy of molecules
- 30 December 1991
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 59 (27) , 3536-3538
- https://doi.org/10.1063/1.105649
Abstract
The imaging resolution of an atomic force microscope operating in contact with a Langmuir–Blodgett (LB) film is predicted as a function of applied force, tip radius, adhesive force, and tip and film properties. The elastic modulus and the hardness of the LB film were measured using a nanoindenter and the imaging resolution is predicted using both a simple Hertzian elastic analysis and one that includes adhesive forces between the tip and the sample. For a small applied force (<1 nN) the resolution improves sharply as the tip radius and the adhesive force decrease. The onset of inelastic deformation, however, limits the resolution of the sharpest tips.Keywords
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