Determination of three parameters of a depth profile of foreign atoms in bulk material using pixe analysis
- 1 September 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 200 (2-3) , 505-509
- https://doi.org/10.1016/0167-5087(82)90477-x
Abstract
No abstract availableKeywords
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