Frequency dependence of surface cyclotron resonance in Si
- 15 September 1976
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 14 (6) , 2494-2497
- https://doi.org/10.1103/physrevb.14.2494
Abstract
Cyclotron resonance on the (100) surface of Si is investigated at frequencies between 94 and 891 GHz. The cyclotron mass, especially its dependence on surface electron density, is found to be independent of frequency in our samples. An increase of the scattering rate with magnetic field is observed.Keywords
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