AuGeNi migration affected by operating conditions of GaAs FETs
- 1 May 1984
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 27 (5) , 447-452
- https://doi.org/10.1016/0038-1101(84)90151-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Anodic Oxidation of GaAs in Mixed Solutions of Glycol and WaterJournal of the Electrochemical Society, 1976
- Electromigration in MetalsPublished by Elsevier ,1975
- Metallic channels formed by high surface fields on GaAs planar devicesElectronics Letters, 1971
- Experiments on heat sinking of semiconductor devicesElectronics Letters, 1971