Accurate experimental characterization of three-ports

This publication has 9 references indexed in Scilit:

• Experimental electrical characterization of high speed interconnects
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Enhanced through-reflect-line characterization of two-port measuring systems using free-space capacitance calculation
  IEEE Transactions on Microwave Theory and Techniques, 1990
• A generalized method for de-embedding of multiport networks
  IEEE Transactions on Instrumentation and Measurement, 1981
• The determination of the scattering parameters of microwave TV-port networks
  IEEE Transactions on Instrumentation and Measurement, 1981
• Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer
  IEEE Transactions on Microwave Theory and Techniques, 1979
• Theoretical and experimental methods for evaluating discontinuities in microstrip
  Radio and Electronic Engineer, 1978
• A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors
  IEEE Transactions on Microwave Theory and Techniques, 1977
• High-Frequency Transistor Evaluation by Three-Port Scattering Parameters (Correspondence)
  IEEE Transactions on Microwave Theory and Techniques, 1967
• Power Gain in Feedback Amplifier
  Transactions of the IRE Professional Group on Circuit Theory, 1954