High resolution transmission electron microscopy (HRTEM) of epitaxially grown ZnSe and ZnSe/GaAs interfaces
- 1 March 1984
- journal article
- Published by Springer Nature in Journal of Materials Science Letters
- Vol. 3 (3) , 189-193
- https://doi.org/10.1007/bf00726789
Abstract
No abstract availableKeywords
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