SEARCH STATE EQUIVALENCE FOR REDUNDANCY IDENTIFICATION AND TEST GENERATION

This publication has 9 references indexed in Scilit:

• ON THE ACCELERATION OF TEST GENERATION ALGORlTHMS
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• EST: the new frontier in automatic test-pattern generation
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Improved deterministic test pattern generation with applications to redundancy identification
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
• Test pattern generation for sequential MOS circuits by symbolic fault simulation
  Published by Association for Computing Machinery (ACM) ,1989
• A topological search algorithm for ATPG
  Published by Association for Computing Machinery (ACM) ,1987
• An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
  IEEE Transactions on Computers, 1981
• Built-in test for complex digital integrated circuits
  IEEE Journal of Solid-State Circuits, 1980
• A Nine-Valued Circuit Model for Test Generation
  IEEE Transactions on Computers, 1976
• Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits
  IEEE Transactions on Electronic Computers, 1967