High resolution and conventional transmission electron microscopy in the characterisation of thin films and interfaces involving II–VI materials
- 2 February 1992
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 117 (1-4) , 441-453
- https://doi.org/10.1016/0022-0248(92)90790-p
Abstract
No abstract availableKeywords
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