Skewed-Load Transition Test: Part II, Coverage
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 714
- https://doi.org/10.1109/test.1992.527893
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Delay Testing Quality in Timing-Optimized DesignsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Skewed-Load Transition Test: Part I, CalculusPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- On computing the sizes of detected delay faultsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990
- Random pattern testability of delay faultsIEEE Transactions on Computers, 1988
- Transition Fault SimulationIEEE Design & Test of Computers, 1987