Analysis of ac Surface Photovoltages in Accumulation Region

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Abstract
Equations for ac surface photovoltages (SPVs) excited with a chopped photon beam (PB) in the accumulation region are proposed for such semiconductors as silicon and germanium. Following the previously reported half-sided junction model for the depleted or inverted region, equations for photocurrent density and surface impedance per unit area have been newly deduced. When the surface potential is highly negative in p-type semiconductors, the maximum ac SPV in the accumulation region is limited by the conductance due to majority carrier diffusion flow. This is compared with the strong inversion region, where the mathematically maximum SPV depends upon the minority carrier diffusion flow. The voltage ratio between the two maximum ac SPVs is the same as that previously reported using the different models for ac SPVs excited with a continuous PB.