Studies on carrier recombination at dislocations in compound semiconductors by combined SEM-CL/EBIC measurements
- 16 August 1993
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 138 (2) , 705-713
- https://doi.org/10.1002/pssa.2211380242
Abstract
No abstract availableKeywords
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- A contribution to the theory of the EBIC contrast of lattice defects in semiconductorsUltramicroscopy, 1981