EBIC Microscopy Applied to Glide Dislocations)
- 15 February 1990
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 117 (2) , 417-428
- https://doi.org/10.1002/pssa.2211170211
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- On the sensitivity of the EBIC technique as applied to defect investigations in siliconPhysica Status Solidi (a), 1981
- A theoretical interpretation of the electrical behaviour of individual edge dislocations in Si as determined by combined EBIC/TEM studiesCrystal Research and Technology, 1981
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