True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy
- 1 January 1996
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact modeJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1996
- Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7Zeitschrift für Physik B Condensed Matter, 1996
- Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force MicroscopyScience, 1995
- Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force MicroscopeJapanese Journal of Applied Physics, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Ultrahigh vacuum atomic force microscope with sample cleaving mechanismJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
- True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive ForcesScience, 1993
- Improved fiber-optic interferometer for atomic force microscopyApplied Physics Letters, 1989
- Atomic Force MicroscopePhysical Review Letters, 1986
- Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopyJournal of Vacuum Science & Technology A, 1985