Latest trends in parts SEP susceptibility from heavy ions
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 2388-2397
- https://doi.org/10.1109/23.45453
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- SEU test techniques for 256 K static RAMs and comparisons of upsets by heavy ions and protonsIEEE Transactions on Nuclear Science, 1988
- A summary of SEU test results using Californium-252IEEE Transactions on Nuclear Science, 1988
- Full temperature single event upset characterization of two microprocessor technologiesIEEE Transactions on Nuclear Science, 1988
- Recent Trends in Parts SEU Susceptibility from Heavy IonsIEEE Transactions on Nuclear Science, 1987
- Trends in Parts Susceptibility to Single Event Upset from Heavy IonsIEEE Transactions on Nuclear Science, 1985