Spectroscopy of surface states using the excess noise in a buried-channel MOS transistor
- 30 September 1992
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 35 (9) , 1285-1289
- https://doi.org/10.1016/0038-1101(92)90163-7
Abstract
No abstract availableKeywords
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