Raman study of amorphous to microcrystalline phase transition in cw laser annealed a-Si:H films
- 1 December 1989
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 66 (11) , 5322-5326
- https://doi.org/10.1063/1.343723
Abstract
The dynamic behavior of continuous wave (cw) laser‐induced crystallization in the a‐Si:H film on a quartz substrate is studied by light scattering. Microcrystals of dimensions less than 30 Å could be grown in a stable state and it is demonstrated that the surface‐to‐volume correction is essential for estimating the frequency of the crystallinelike mode. It is suggested that bulk‐induced crystallization may be responsible for the formation of very small crystallites.This publication has 14 references indexed in Scilit:
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