1f, g-r and burst noise induced by emitter-edge dislocations in bipolar transistors
- 31 July 1984
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 27 (7) , 675-676
- https://doi.org/10.1016/0038-1101(84)90138-2
Abstract
No abstract availableKeywords
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