Scanning Acoustic Microscopy in Electronics Research
- 1 March 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Sonics and Ultrasonics
- Vol. 32 (2) , 320-324
- https://doi.org/10.1109/t-su.1985.31598
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Water acoustic microscopy at suboptical wavelengthsApplied Physics Letters, 1983
- Rayleigh wave suppression in reflection acoustic microscopyElectronics Letters, 1983
- Acoustical contrast of a dislocation line in an isotropic mediumJournal of Applied Physics, 1983
- Study of defects in optoelectronic materials using a scanning acoustic microscopeJournal of Applied Physics, 1983
- Pulse compression acoustic microscopy at 750 MHzElectronics Letters, 1983
- SAW attenuation measurement in the acoustic microscopeElectronics Letters, 1982
- Pulse-compression subsurface acoustic microscopyElectronics Letters, 1982
- Observation of surface cracks with scanning acoustic microscopeJournal of Applied Physics, 1982
- Applications of Acoustic Microscopy in the Semiconductor IndustryPublished by Springer Nature ,1982
- Film adhesion studies with the acoustic microscpeThin Solid Films, 1980