Cobalt60 and proton radiation effects on large format, 2-D, CCD arrays for an Earth imaging application

This publication has 17 references indexed in Scilit:

• Displacement damage in Si imagers for space applications
  Published by SPIE-Intl Soc Optical Eng ,1991
• Proton-induced displacement damage distributions and extremes in silicon microvolumes charge injection device
  IEEE Transactions on Nuclear Science, 1990
• Single defects and noise in sub-μ MOSFETs
  Published by SPIE-Intl Soc Optical Eng ,1990
• Individual defects at the Si:SiO₂interface
  Semiconductor Science and Technology, 1989
• Enhanced displacement damage effectiveness in irradiated silicon devices
  IEEE Transactions on Nuclear Science, 1989
• Radiation damage effects on imaging charge coupled devices
  Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1989
• Fano-Noise-Limited CCDs
  Published by SPIE-Intl Soc Optical Eng ,1988
• Counting of deep-level traps using a charge-coupled device
  IEEE Transactions on Electron Devices, 1987
• Recombination along the tracks of heavy charged particles in SiO2 films
  Journal of Applied Physics, 1985
• A technique for suppressing dark current generated by interface states in buried channel CCD imagers
  IEEE Electron Device Letters, 1980