Kinetic critical thickness for surface wave instability vs. misfit dislocation formation in GexSi1−x/Si (100) heterostructures
- 1 May 1997
- journal article
- Published by Elsevier in Physica A: Statistical Mechanics and its Applications
- Vol. 239 (1-3) , 11-17
- https://doi.org/10.1016/s0378-4371(97)00019-8
Abstract
No abstract availableKeywords
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