Electro-optic sampling measurements of high-speed InP integrated circuits
- 11 May 1987
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 50 (19) , 1310-1312
- https://doi.org/10.1063/1.97891
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Direct electro-optic sampling of a GaAs integrated circuit using a gain-switched InGaAsP injection laserElectronics Letters, 1986
- Monolithically integrated enhancement-mode InP MISFET inverterElectronics Letters, 1986
- Electro-optic sampling of fast electrical signals using an InGaAsP injection laserElectronics Letters, 1986
- Electrooptic sampling in GaAs integrated circuitsIEEE Journal of Quantum Electronics, 1986
- Subpicosecond electrooptic sampling: Principles and applicationsIEEE Journal of Quantum Electronics, 1986
- Electro-optic sampling of planar digital GaAs integrated circuitsApplied Physics Letters, 1985
- Direct electro-optic sampling of GaAs integrated circuitsElectronics Letters, 1985
- Low-power high-speed InP MISFET direct-coupled FET logicIEEE Transactions on Electron Devices, 1984
- Electrooptic Properties and Raman Scattering in InPJapanese Journal of Applied Physics, 1984
- Integrated PINFET optical receiver with high-frequency InP-MISFETElectronics Letters, 1983