Role of copper in electromigration lifetimes of aluminum alloy conductors
- 10 September 1990
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 57 (11) , 1167-1168
- https://doi.org/10.1063/1.103518
Abstract
Recent experimental results have indicated that the traditionally conceived role of copper in Al/Cu alloys in electromigration resistance may not be correct. A simple model is proposed based on Al/Cu intermetallic precipitates acting as local diffusion barriers limiting vacancy availability.Keywords
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