On the Investigation of Power and Reliability Performance of Pseudomorphic AlGaAs/InGaAs HEMT's
- 1 January 1996
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- High efficiency microwave power AlGaAs/InGaAs PHEMTs fabricated by dry etch single gate recessIEEE Transactions on Electron Devices, 1995
- Optimization of a power pseudomorphic double heterojunction FETMicrowave and Optical Technology Letters, 1994
- High-efficiency HBT MMIC linear power amplifier for L-band personal communications systemsIEEE Microwave and Guided Wave Letters, 1994
- Impact ionization and light emission in high-power pseudomorphic AlGaAs/InGaAs HEMTsIEEE Transactions on Electron Devices, 1993
- Mobile broadband system (MBS): Trends and impact on 60 GHz band MMIC developmentElectronics & Communication Engineering Journal, 1993
- 0.25- mu m pseudomorphic HEMTs processed with damage-free dry-etch gate-recess technologyIEEE Transactions on Electron Devices, 1992
- Optimization of ohmic contacts for reliable heterostructure GaAs materialsJournal of Electronic Materials, 1990
- Microwave power double-heterojunction HEMT'sIEEE Transactions on Electron Devices, 1986
- Control of gate—Drain avalanche in GaAs MESFET'sIEEE Transactions on Electron Devices, 1980
- Light emission and burnout characteristics of GaAs power MESFET'sIEEE Transactions on Electron Devices, 1978