Built-in Self-Test for Digital Integrated Circuits

4 March 1994

journal article
website
Published by Institute of Electrical and Electronics Engineers (IEEE) in AT&T Technical Journal

Vol. 73 (2) , 30-39
https://doi.org/10.1002/j.1538-7305.1994.tb00576.x

Abstract

The increasing complexity of digital integrated circuits (ICs) and the requirements of system quality and availability demand a new discipline in IC testing, known as built-in self-test (BIST). This paper introduces the basic approaches of this self-...

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