Mismatch Characterization of Ring Oscillators
- 1 September 2007
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 08865930,p. 515-518
- https://doi.org/10.1109/cicc.2007.4405784
Abstract
We investigate the frequency matching of ring oscillators to study the matching of the non-static operation of identical high speed analog, digital and RF circuits. The oscillator test structures on a 0.25 μ m CMOS technology operate in the 500MHz to 3GHz range. The non-static matching experimental results are compared to predictions based on DC matching parameters. Stage averaging versus device size averaging for constant frequency designs is investigated. Global variations and the long distance matching are also examined and compared.Keywords
This publication has 16 references indexed in Scilit:
- A Sub-Picosecond Resolution 0.5-1.5GHz Digital-to-Phase ConverterPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- Ring Oscillators for CMOS Process Tuning and Variability ControlIEEE Transactions on Semiconductor Manufacturing, 2006
- High-frequency measurements of the mismatch on the Y-parameters of high-speed SiGe:C HBTsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- High frequency mismatch characterization on 170GHz HBT NPN bipolar devicePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- Device mismatch and tradeoffs in the design of analog circuitsIEEE Journal of Solid-State Circuits, 2005
- Analysis and Characterization of Device Variations in an LSI Chip Using an Integrated Device Matrix ArrayIEEE Transactions on Semiconductor Manufacturing, 2004
- The Design of CMOS Radio-Frequency Integrated CircuitsPublished by Cambridge University Press (CUP) ,2003
- Within-chip variability analysisPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- An injection-locking scheme for precision quadrature generationIEEE Journal of Solid-State Circuits, 2002
- Impact of spatial intrachip gate length variability on the performance of high-speed digital circuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2002