On path delay testing in a standard scan environment
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 27 references indexed in Scilit:
- AC Test Quality: Beyond Transition Fault CoveragePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Amdahl Corporation Board Delay Test SystemPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- On Multiple Path Propagating Tests for Path Delay FaultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- On the detection of delay faultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- On the over-specification problem in sequential ATPG algorithmsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Delay fault test generation for scan/hold circuits using Boolean expressionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Delay fault models and test generation for random logic sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- At-speed delay testing of synchronous sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Random pattern testability of delay faultsIEEE Transactions on Computers, 1988
- On the Acceleration of Test Generation AlgorithmsIEEE Transactions on Computers, 1983