Hierarchical yield estimation of large analog integrated circuits
- 1 March 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 28 (3) , 203-209
- https://doi.org/10.1109/4.209986
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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