Delay testing for non-robust untestable circuits
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- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 954-961
- https://doi.org/10.1109/test.1993.470604
Abstract
Recently published results have shown that, for many circuits, only a small percentage of path delay faults is robust testable. Among the robust untestable faults, a significant percentage of them is not non-robust testable either. In this paper, we take a closer look at the properties of these non-robust untestable faults with the goal of determining whether and how these faults should be tested.Keywords
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