Effect of silicon doping on the optical and transport properties of InGaN/GaN multiple-quantum-well structures
- 27 March 2000
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 76 (13) , 1737-1739
- https://doi.org/10.1063/1.126151
Abstract
Temperature-dependent photoluminescence and transport measurements were performed on the In 0.13 Ga 0.87 N:Si/GaN:Si multiple-quantum-well(MQW) structures with different doping levels. By fitting the temperature-dependent emission energy of these samples using the band tail model, an obvious localization effect is observed in lightly dopedMQW structures. Correspondingly, the electron mobilities in these structures are significantly higher than those of undoped and heavily dopedMQW structures. Furthermore, when the localization effect is stronger, the mobility is higher.Keywords
This publication has 12 references indexed in Scilit:
- Spiral growth of InGaN/InGaN quantum wells due to Si doping in the barrier layersApplied Physics Letters, 1999
- Influence of Si doping on characteristics of InGaN/GaN multiple quantum wellsApplied Physics Letters, 1998
- Effects of Si-doping in the barriers of InGaN multiquantum well purplish-blue laser diodesApplied Physics Letters, 1998
- Luminescence spectra from InGaN multiquantum wells heavily doped with SiApplied Physics Letters, 1998
- Characterization of AlGaInN diode lasers with mirrors from chemically assisted ion beam etchingApplied Physics Letters, 1998
- InGaN/GaN/AlGaN-Based Laser Diodes with Modulation-Doped Strained-Layer SuperlatticesJapanese Journal of Applied Physics, 1997
- “Blue” temperature-induced shift and band-tail emission in InGaN-based light sourcesApplied Physics Letters, 1997
- Recombination dynamics of localized excitons in N-N multiple quantum wellsPhysical Review B, 1997
- Characteristics of Indium-Gallium-Nitride Multiple-Quantum-Well Blue Laser Diodes Grown by MOCVDMRS Internet Journal of Nitride Semiconductor Research, 1997
- Shortest wavelength semiconductor laser diodeElectronics Letters, 1996