Thermal conductivity of SiO2 films by scanning thermal microscopy
- 1 April 1999
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 245 (1-3) , 203-209
- https://doi.org/10.1016/s0022-3093(98)00863-1
Abstract
No abstract availableKeywords
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