Scanning photocurrent microscopy: A new technique to study inhomogeneously distributed recombination centers in semiconductors
- 31 December 1978
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 21 (11-12) , 1519-1524
- https://doi.org/10.1016/0038-1101(78)90235-6
Abstract
No abstract availableKeywords
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