A new application of electron energy loss spectroscopy technique for a non-destructive study of the Si-SiO2 interface
- 30 November 1980
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 36 (8) , 695-699
- https://doi.org/10.1016/0038-1098(80)90211-2
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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