A 12-ns low-temperature DRAM

This publication has 14 references indexed in Scilit:

• A new failure mode of radiation-induced soft errors in dynamic memories
  IEEE Electron Device Letters, 1988
• A 14ns 1mb Cmos Sram With Variable Bit-organization
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1988
• An experimental 1-Mbit BiCMOS DRAM
  IEEE Journal of Solid-State Circuits, 1987
• Noise-generation analysis and noise-suppression design techniques in megabit DRAMs
  IEEE Journal of Solid-State Circuits, 1987
• Foreword
  IEEE Transactions on Electron Devices, 1987
• Alpha-particle-induced failure modes in dynamic RAMs
  Electronics Letters, 1985
• Circuit design methodologies
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1983
• A soft error rate model for MOS dynamic RAM's
  IEEE Transactions on Electron Devices, 1982
• Behavior of electrically small depletion mode MOSFETs at low temperature
  Solid-State Electronics, 1981
• Very small MOSFET's for low-temperature operation
  IEEE Transactions on Electron Devices, 1977