Measuring and fitting the MOS transistor at high frequencies
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 37 (4) , 591-595
- https://doi.org/10.1109/19.9820
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- On the small-signal behaviour of the MOS transistor in quasistatic operationSolid-State Electronics, 1983
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- Calibration of microwave network analyser for computer-corrected S parameter measurementsElectronics Letters, 1973