Electromigration-induced dislocation climb and multiplication in conducting lines
- 30 November 1994
- journal article
- Published by Elsevier in Acta Metallurgica et Materialia
- Vol. 42 (11) , 3581-3588
- https://doi.org/10.1016/0956-7151(94)90424-3
Abstract
No abstract availableKeywords
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