Accurate capacitor matching measurements using floating gate test structures
- 19 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Design of matching test structures [IC components]Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Process dependence on two-capacitor matching properties with different etching techniqueIEEE Transactions on Electron Devices, 1992
- On-chip quasi-static floating-gate capacitance measurement methodPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1990
- Matching properties of linear MOS capacitorsSolid-State Electronics, 1989
- Precision measurement technique of integrated MOS capacitor mismatching using a simple on-chip circuitIEEE Transactions on Electron Devices, 1986
- Random error effects in matched MOS capacitors and current sourcesIEEE Journal of Solid-State Circuits, 1984
- Matching properties, and voltage and temperature dependence of MOS capacitorsIEEE Journal of Solid-State Circuits, 1981
- Precision Capacitor Ratio Measurement Technique for Integrated Circuit Capacitor ArraysIEEE Transactions on Instrumentation and Measurement, 1979