Structure and dynamics of carbon, silicon, and hydrogen complexes in AlAs, GaAs, and As
- 15 September 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 52 (11) , 8121-8131
- https://doi.org/10.1103/physrevb.52.8121
Abstract
The results of a comprehensive Green’s-function calculation are reported for the structure and dynamics of the amphoteric behavior of silicon {,}, and the acceptor nature of beryllium and carbon {,} impurities in GaAs, AlAs, and As. Impurity vibrational modes are studied for (i) the nearest-neighbor - pairs ( symmetry) in As (for x<0.04), (ii) the second-nearest-neighbor {e.g., -Al(Ga)-; -As-} pairs ( / symmetry) in AlAs (GaAs), and (iii) the passivated H- complexes in GaAs and AlAs. Comparisons are made with the existing experimental and theoretical data.
Keywords
This publication has 37 references indexed in Scilit:
- Fine structure of the LVM-lines from (CAs-Asi) complexes in irradiated GaAsJournal of Molecular Structure, 1991
- Characterization of the GaAs: C and AlGaAs: C doping superlattice grown by chemical beam epitaxyJournal of Crystal Growth, 1991
- Heterostructure bipolar transistor employing carbon-doped base grown with trimethyl-Ga and arsineElectronics Letters, 1990
- Chemical beam epitaxial growth of strained carbon-doped GaAsApplied Physics Letters, 1990
- Ultrahigh doping of GaAs by carbon during metalorganic molecular beam epitaxyApplied Physics Letters, 1989
- Heavy carbon doping of metalorganic chemical vapor deposition grown GaAs using carbon tetrachlorideApplied Physics Letters, 1989
- Carbon doping in molecular beam epitaxy of GaAs from a heated graphite filamentApplied Physics Letters, 1988
- Ultra-high doping levels of GaAs with beryllium by molecular beam epitaxyElectronics Letters, 1985
- Direct evidence for the site of substitutional carbon impurity in GaAsApplied Physics Letters, 1982
- The Use of Si and Be Impurities for Novel Periodic Doping Structures in GaAs Grown by Molecular Beam EpitaxyJournal of the Electrochemical Society, 1981