Hierarchical Test Generation Based on Delayed Propagation
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Macro Testing: Unifying IC And Board TestIEEE Design & Test of Computers, 1986
- Functional Testing of MicroprocessorsIEEE Transactions on Computers, 1984