Hierarchical test generation for data path
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Hierarchical test pattern generation based on high-level primitivesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A framework and method for hierarchical test generationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Symbolic test generation for hierarchically modeled digital systemsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- The KARL/KARATE system-automatic test pattern generation based on RT level descriptionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Experience in functional-level test generation and fault coverage in a silicon compilerPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- On the Acceleration of Test Generation AlgorithmsIEEE Transactions on Computers, 1983
- Design of Easily Testable Bit-Sliced SystemsIEEE Transactions on Computers, 1981
- Efficient Algorithms for Testing Semiconductor Random-Access MemoriesIEEE Transactions on Computers, 1978
- Easily Testable Iterative SystemsIEEE Transactions on Computers, 1973
- Fault Detection in Iterative Logic ArraysIEEE Transactions on Computers, 1971