Attractive-mode atomic force microscopy with optical detection in an orthogonal cantilever/sample configuration
- 15 March 1992
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 71 (6) , 2499-2502
- https://doi.org/10.1063/1.351064
Abstract
An attractive-mode atomic force microscope is described in which the cantilever is held orthogonally with respect to the sample. The technique utilizes a linear differential optical detection scheme for the cantilever vibrations. In this design, the cantilever end is not bent to form a tip. This geometry substantially reduces the possibility of spontaneous jump-to-contact of the tip onto the sample, allowing the tip/sample separation to be set essentially to any desired value. Relatively large- and small-scale results are presented on imaging a smear of red blood cells, demonstrating the resolution and sensitivity.This publication has 22 references indexed in Scilit:
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