Hydrogen and Deuterium Ion Bombardment Effects in SiO2 Films
- 1 January 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 26 (6) , 4819-4823
- https://doi.org/10.1109/tns.1979.4330234
Abstract
No abstract availableKeywords
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